A highly stable, substantial microscope suitable for viewing silicon wafers, assemblies and standard metallurgical reflective specimens.
It is equipped with a trinocular head ready for the attachment of a digital camera.
This microscope includes a full set of high quality plan achromatic materials objectives. Specimens can placed on the mechanical stage with controls for XY stage movement including a rapid traverse override control, perfect for scanning over large areas. The focussing tension can be adjusted and a focus lock protects the objectives from damage.
Illumination is provided from an integral LED reflected light illuminator with adjustable intensity, field and aperture diaphragms, polariser and set of Y, G, B and diffusion filters.
This microscope is built on GX Microscopes most substantial and highly robust XJL upright series industrial microscope frame which provides high stability and a durable platform suitable for the most demanding of applications. Options include a range of camera adapters, digital cameras, image analysis software, additional objectives and eyepieces.